Total **Test 60**

**Price 1000.00**

**Discounted Price 499.00**

Buy Now

**Engineers Academy** presenting this **GATE 2020 Online Test Series** for **ELECTRONICS BRANCH (EC**) with 60 Online Test In just Rs 499/- (Worth Rs 1000) that will help you to boost your preparation. This package offers you 60 online tests with full length and subject wise. Tests Series is according to the new pattern.

**Number of Tests**- 60

**Test Series is Started from 15th April 2019.**

__Features-__

1) All test available till GATE-2020 Exam.

2) Detailed Solutions for each test.

3) OTS Discussion Counter.

4) Authentic Questions.

5) As per GATE Pattern

6) Error Free Test Series

**GATE 2020 – ELECTRONICS Branch (EC) Online Test Series Schedule**

Test Code | Type of Test | Starting Date | Subject | Syllabus | No of Question | Marks | Time | Validity |
---|---|---|---|---|---|---|---|---|

ECE01 | Part Test | 15-Apr | Network Theory-1 | Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Nortonâ€™s, maximum power transfer; Wyeâ€Delta transformation, Two port network | 22Questions | 35 | 60Min | Till Gate Exam |

ECE02 | Part Test | 15-Apr | Network Theory-2 | Steady state sinusoidal analysis using phasors; Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain; State equations for networks. analysis of RLC circuits; Linear | 22Questions | 35 | 60Min | Till Gate Exam |

ECE03 | Part Test | 15-Apr | Control System-1 | Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Routh â€“ Hurwitz stability criteria, root-locus plot. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE04 | Part Test | 15-Apr | Control System-2 | Frequency response; Nyquist stability criteria; Bode Plot, Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems | 22Questions | 35 | 60Min | Till Gate Exam |

ECE05 | Part Test | 15-Apr | Signal & System-1 | Introduction to signals, LTI systems: definition and properties, causality, stability, impulse response, convolution. Fourier series and Fourier transform representations. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE06 | Part Test | 6-May | Signal & System-2 | Sampling theorem and its application ,Laplace transform, discrete-time Fourier transform (DTFT), DFT, FFT, Z-transform, interpolation of discrete-time signals, poles and zeros, parallel and cascade structure, group delay and phase delay, digital filter design | 22Questions | 35 | 60Min | Till Gate Exam |

ECE07 | Part Test | 6-May | Analog Electronics-1 | Small signal equivalent circuits of diodes, BJTs ; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; multi-stage feedback | 22Questions | 35 | 60Min | Till Gate Exam |

ECE08 | Part Test | 6-May | Analog Electronics-2 | mosfet and mosfet amplifiers Differential, power and operational; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op- amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE09 | Part Test | 6-May | Digital Electrinics+Micro Processor-1 | Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; | 22Questions | 35 | 60Min | Till Gate Exam |

ECE10 | Part Test | 6-May | Digital Electrinics+Micro Processor-2 | Sequential circuits: latches and flipâ€flops, counters, shiftâ€registers and finite state machines. Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM, 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE11 | Part Test | 24-May | EDC-1 | Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode, BJT. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE12 | Part Test | 24-May | EDC-2 | MOS capacitor, MOSFET, LED, photo diode and solar cell; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE13 | Part Test | 24-May | EMFT-1 | Electrostatics; Maxwellâ€™s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE14 | Part Test | 24-May | EMFT-2 | Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE15 | Part Test | 24-May | Communication Systems-1 | Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications. Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; ; Information theory: entropy, mutual information and channel capacity theorem. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE16 | Part Test | 17-Jun | Communication Systems-2 | Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, inter-symbol interference and its mitigation; Basics of TDMA, FDMA and CDMA. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE17 | Part Test | 17-Jun | Maths-1 | Linear Algebra, Calculus, Differential Equations and Vector Analysis. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE18 | Part Test | 17-Jun | Maths-2 | Complex Anaysis, Numerical Methods and Probability and Statistics. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE19 | Part Test | 17-Jun | General Apti-1 | English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE20 | Part Test | 17-Jun | General Apti-2 | Numerical computation, numerical estimation, numerical reasoning and data interpretation. | 22Questions | 35 | 60Min | Till Gate Exam |

ECE21 | Subject Test | 8-Jul | Network Theory | Network Theory | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE22 | Subject Test | 8-Jul | Signal & System | Signal & System | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE23 | Subject Test | 8-Jul | Control System | Control System | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE24 | Subject Test | 8-Jul | Analog Electronics | Analog Electronics | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE25 | Subject Test | 8-Jul | Digital Electronics+Micro Processor | Digital Electronics+Micro Processor | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE26 | Subject Test | 29-Jul | EDC | EDC | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE27 | Subject Test | 29-Jul | EMFT | EMFT | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE28 | Subject Test | 29-Jul | Communication Systems | Communication Systems | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE29 | Subject Test | 29-Jul | Maths | Maths | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE30 | Subject Test | 29-Jul | General Aptitude | General Aptitude | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE31 | Cascaded Test | 19-Aug | Network Theory+Control System | Network Theory+Control System | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE32 | Cascaded Test | 19-Aug | Signal & System+Digital Electronics+Micro Processor | Signal & System+Digital Electronics+Micro Processor | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE33 | Cascaded Test | 19-Aug | EDC+AE | EDC+AE | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE34 | Cascaded Test | 19-Aug | EMFT+Communication Systems | EMFT+Communication Systems | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE35 | Cascaded Test | 19-Aug | Maths+Apti | Maths+Apti | 35 Questions | 50 | 90 Min | Till Gate Exam |

ECE36 | Full Length Test | 9-Sep | Full Syllabus-1 | Full Syllabus-1 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE37 | Full Length Test | 9-Sep | Full Syllabus-2 | Full Syllabus-2 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE38 | Full Length Test | 9-Sep | Full Syllabus-3 | Full Syllabus-3 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE39 | Full Length Test | 9-Sep | Full Syllabus-4 | Full Syllabus-4 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE40 | Full Length Test | 9-Sep | Full Syllabus-5 | Full Syllabus-5 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE41 | Full Length Test | 30-Sep | Full Syllabus-6 | Full Syllabus-6 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE42 | Full Length Test | 30-Sep | Full Syllabus-7 | Full Syllabus-7 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE43 | Full Length Test | 30-Sep | Full Syllabus-8 | Full Syllabus-8 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE44 | Full Length Test | 30-Sep | Full Syllabus-9 | Full Syllabus-9 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE45 | Full Length Test | 30-Sep | Full Syllabus-10 | Full Syllabus-10 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE46 | Mock Test | 21-Oct | Mock Test-1 | Mock Test-1 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE47 | Mock Test | 21-Oct | Mock Test-2 | Mock Test-2 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE48 | Mock Test | 21-Oct | Mock Test-3 | Mock Test-3 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE49 | Mock Test | 21-Oct | Mock Test-4 | Mock Test-4 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE50 | Mock Test | 21-Oct | Mock Test-5 | Mock Test-5 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE51 | Mock Test | 18-Nov | Mock Test-6 | Mock Test-6 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE52 | Mock Test | 18-Nov | Mock Test-7 | Mock Test-7 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE53 | Mock Test | 18-Nov | Mock Test-8 | Mock Test-8 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE54 | Mock Test | 18-Nov | Mock Test-9 | Mock Test-9 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE55 | Mock Test | 18-Nov | Mock Test-10 | Mock Test-10 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE56 | Mock Test | 16-Dec | Mock Test-11 | Mock Test-11 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE57 | Mock Test | 16-Dec | Mock Test-12 | Mock Test-12 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE58 | Mock Test | 16-Dec | Mock Test-13 | Mock Test-13 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE59 | Mock Test | 16-Dec | Mock Test-14 | Mock Test-14 | 65 Questions | 100 | 180 Min | Till Gate Exam |

ECE60 | Mock Test | 16-Dec | Mock Test-15 | Mock Test-15 | 65 Questions | 100 | 180 Min | Till Gate Exam |